ESD & Latch-up Tester ~ Model 7000 Series |
- Allows ESD(HBM and MM) and Latch-up Tests
- Meets JEDEC, MIL, ESD Association and EIAJ standards, as well as future standards
- Drastic Test Time Reduction
- True constant current pulse and fast pulsed power supply
- Stabilizes DUT by pull-up/down and pattern generator
- Collects detail test results quickly by auto or manual operation
- Allows temperature coefficient test
- Minimum path resistance of power supplies
- Damage detection between tests
- Discharge between zap(s)
- Tests multiple DUT, multiple supply DUT and LCD drivers
- Function test available
- Low insertion force connectors on DUT board
- Complete diagnostics and easy maintenance
- Connectable with Ethernet
- Allows data manipulation by the data base program
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CDM Test System ~ CDM-550Series |
- Field induced CDM via relay
- Stable and repeatable
- Current measurement at DUT pin side
- Coulomb measurement up to 100nC
- Simple pin positioning
- Automated test up to 10 DUT’s
- Measure damage voltage or energy
- Waveform Test results available to the production
- Fully automated CDM test
- Automatic test of VQFP and UQFP
- Test results handled by data base
- Test results transferred via LAN
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ECDM Test System - ECDM-100E/400E Series |
6 Functions in a Compact Bench Top Unit
- Field Induced CDM
- Direct Charging CDM
- HBM, Human Body Model
- MM, Machine Model
- TLP, Pulse Curve Measurement
- Mobile Charge Measurement
Meets MIL, JEDEC or JEITA standards
ESD simulation at a low cost.
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ECDM 400S – Wafer Platform |
- ESD Performance Test from Wafer to package
- Meets MIL, JEDEC or JEITA standards
- Able to perform HBM, MM, FI-CDM and D-CDM tests
- Process Monitoring by periodical wafer test
- Allows correlation test between die location and ESD performance
- Multiple return allows ESD current path verification
- Enables rapid ESD performance test of new devices
- Decreases device development time
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ESD Event Detector ~ EV-10A
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- ESD Detection:Higher sensitivity, Broader BW
- Detect Field Induction (DCI) Threat
- PC logs data from multiple Units
- Digitized measurement
- Temperature and humidity monitor
- Both ESD and DCI detected simultaneously
- Electromagnetic wave generated by the ESD is received by the monopole antenna, amplified then peak value is measured.
- ESD polarity is decided whichever greater, positive or negative peak.
- Detection level: 1mV – 35mV at antenna
- Detected band width:About up to 2GHz
- Distance from ESD source: About 5 meters
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